Samples were analyzed using an Agilent 6890N GC system with a 5975 inert XL MS detector and 7683B auto-injector. Separation was done on an HP5MS capillary column (30 m × 0.25 mm, 0.25 μm film). A 1.0 μL sample was injected with a 100:1 split ratio. Helium was used as the carrier gas at 1.2 mL/min. The column temperature was ramped from 150°C to 250°C at 4°C/min, with a 1-minute initial and 5-minute final hold. Electron ionization (70 eV) was used, with injector and transfer line temperatures at 250°C and 260°C, respectively. The scan range was 30–550 m/z. Compounds were identified by comparing retention times with known standards and verifying MS spectra against the NIST library. Samples were analyzed using an Agilent 6890N GC system with a 5975 inert XL MS detector and 7683B auto-injector. Separation was done on an HP5MS capillary column (30 m × 0.25 mm, 0.25 μm film). A 1.0 μL sample was injected with a 100:1 split ratio. Helium was used as the carrier gas at 1.2 mL/min. The column temperature was ramped from 150°C to 250°C at 4°C/min, with a 1-minute initial and 5-minute final hold. Electron ionization (70 eV) was used, with injector and transfer line temperatures at 250°C and 260°C, respectively. The scan range was 30–550 m/z. Compounds were identified by comparing retention times with known standards and verifying MS spectra against the NIST library. Samples were analyzed using an Agilent 6890N GC system with a 5975 inert XL MS detector and 7683B auto-injector. Separation was done on an HP5MS capillary column (30 m × 0.25 mm, 0.25 μm film). A 1.0 μL sample was injected with a 100:1 split ratio. Helium was used as the carrier gas at 1.2 mL/min. The column temperature was ramped from 150°C to 250°C at 4°C/min, with a 1-minute initial and 5-minute final hold. Electron ionization (70 eV) was used, with injector and transfer line temperatures at 250°C and 260°C, respectively. The scan range was 30–550 m/z. Compounds were identified by comparing retention times with known standards and verifying MS spectra against the NIST library.
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